LED Test Equipment [SEIWA ELECTRIC MGF.CO.,LTD.]
LED Die Brightness / Wavelength Sorter
Model:ALPHA 3200/3200F
Features
- Possible to measure LED Die’s Brightness/wavelength factor at the same time and then classifies them into maximum 32 tracks depend on the measurement data. (Standard 21 ranks)
- Parallel driving with high speed rotation table makes High Throughput 0.8 sec/Die.
- On-top double electrodes, On-top single electrode and Flipping Die (ALPHA3200F) can be sorted.
- Die shape inspection can be realized with image processing.
- User-friendly operation with 10-inch touch panel screen.
- Compact design and minimized footprint.
| <Machine Specification> | |
|---|---|
| Dimension | 990W x 1120D x 1817H mm |
| Weight | 600kg approx |
| Power | 100V±10% 50/60Hz (1.2kW) |
| Air (provided by customer) |
Dry clean air 0.5-0.7MPa |
| Vacuum (provided by customers) |
Less than 13 x 103Pa |
| Operating Condition | 17-28℃, 40-70% RH |
| <LED Chip/Wafer> | |
|---|---|
| Standard Aluminum Wafer Ring |
OD dia. 145mm, ID dia. 130mm Sheet: more than 160mm SQ |
| Pick Up Area | Max. dia. 100mm |
| Chip Size | 0.2-0.5mm SQ up to 1mm is available as option |
| Chip Thickness | 0.09-0.5mm (distribution less than 10% sheet) |
| Chip Rotation | Less than 15 degree |
| Electrode | More than dia. 0.1mm |
| <Measurement> | |
|---|---|
| Optical Characteristics |
Polychrome meter: Relative Brightness & Wavelength (peak/ dominant) λd: 380-780nm, λp: 380-980nm etc: (x,y), purity |
| Condition of lighting | Lighting with Stage current (0.001-100mA) or Stable Voltage (0.01-10V) |
| Forward Voltage | 0.01-10V (IF = 0.001-100mA 10points) |
| Forward Current | 0.01-100mA (VF = 0.0-10V 10points) * Higher impression current range 0.001-1000mA is available as optional function |
| Reverse Voltage | 0-100 V (IR= 0-100μA) |
| Reverse Current | 1-100μA (VR= 0-100V) |
| Die shape inspection | OK/NG judgment is to be done by area ratio or pattern matting. Pickup process is skipped as to NG Die. |
| <Others> Tact time is according to the data by standard optical instrument | |
|---|---|
| Tact Time | min. 0.8sec/chip w/o Data output |
| No. of Sorted rank | Brightness/ Wave length: Matrix placement (max 31 ranks) + NG sheet (option), Standard 20 rank + NG sheet |
| Operation | Selective operation screen (touch panel): Sorting Adjustment, Setting, Chip Information |
| Measured Data | Display / Output of measurement Data at real time |
| Memory Capacity of Set Condition | Set Condition/ Wafer : max 100kinds |
| Data Output | RS232C (Measured data, Mapping Position Data, etc.) |
